AT.2048

Easy to Use Rugged Test Platform

Designed for field use, the AT.2048 is a rugged battery powered hand-held test tool for technicians and engineers. Equipped with a colour touch high resolution TFT display, easy to use GUI, and integral test interfaces, the AT.2048 is the ideal field tool. At just under 1Kg in weight, and equipped with Lithium-Ion batteries, the AT.2048 can operate for up to 24 Hours in E1 Mode with two battery packs.

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Multi-Interface Capability

When testing E1 circuits you need a single tester equipped with all the necessary interfaces, not only for the E1 trunks but also for any Datacom interfaces on the multiplexer. The AT.2048 comes equipped with Dual E1 interfaices (Balanced and Unbalanced), and has Datacom test capability for V.24/RS232, V.11/X.24, V.35, V.36/RS449, it also supports  G.703 (2048/704kbit/s), G.703 co-directional and contra-directional interfaces.

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Mux/Demux

The AT.2048 has a powerful Miux/Demux operation mode for use when testing with a TDM multiplexer or similar. Using the Mux/Demux capability it is possible to set different actions on all timeslots/signals including sending signals to the pattern generator (BERT), connect to the analogue output/input such as a headset, connect to a digital input/output such as a datacom port, and connect to the internal tone generator.

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Pulse Mask Analysis

A Pulse Mask Analysis test is available on the unit to check that the detected E1 input (balanced and unbalanced ) is compliant with the pulse mask specified in ITU-T G.703. The signal is monitored, analysed and compered with the ITU-T mask, and the unit will automatically display if the signal is within specification.

Jitter & Wander

Jitter occurs when a signal incurs phase osicalltaiton higher than 10Hz, and can cause errors and slips in the signal causing data and voice corruption on E1 circuits. The AT.2048 Jitter test allows users to analyse the jitter on received signals to ensure it is within limits, it is also possible to generate Jitter on the outgoing signal to test that equipment under test is tolerant of Jitter. When slow phase fluctuations occur this is known Wander, this can propogate through the network where it accumulates causing Jitter, Slips and bit errors. AT.2048 can measure the Wander on an E1 circuit including the time interval error (TIE), and the maximum time interval error (MTIE), providing both tabular results and graphical plots and in both cases results are compared to the relevant standards mask for the test.